JEDEC JESD22-A117E 电可擦除可编程只读存储器（EEPROM）编程擦除耐久性以及数据保持试验

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JEDEC

STANDARD

Electrically Erasable Programmable

ROM (EEPROM) Program / Erase

Endurance and Data Retention Stress

Test

JESD22-A117E

(Revision of JESD22-A117D, August 2018)

NOVEMBER 2018

JEDEC Solid State Technology Association

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标签： #耐久性 #JEDEC

摘要：

本文详细介绍 JEDEC JESD22-A117E 标准，该标准专门规范了电可擦除可编程只读存储器（EEPROM）在编程擦除耐久性以及数据保持方面的试验方法与要求。内容包括对EEPROM器件在反复编程与擦除循环后性能退化的评估流程，以及在不同温度与时间条件下数据保持能力的测试标准。该文档适用于半导体制造商、质量工程师及可靠性测试人员，旨在确保EEPROM在长期使用中的稳定性和可靠性，满足工业与消费电子产品的耐久性需求。

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JEDEC JESD22-A117E 电可擦除可编程只读存储器（EEPROM）编程擦除耐久性以及数据保持试验

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