IEEE Std 1671.1-2017

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Carl 2024-09-06 38 4.65MB 274 页 20星币
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IEEE Standard for Automatic Test
Markup Language (ATML) Test
Descriptions
Sponsored by the
IEEE Standards Coordinating Committee 20 (SCC20) on
T
est and Dia
g
nosis for Electronic S
y
stems
IEEE
3 Park Avenue
New York, NY 10016-5997
USA
IEEE Standards Coordination Committee 20
IEEE Std 1671.1™-2017
(Revisionof
IEEEStd1671.1‐2009)
IEEE Std 1671.1™-2017
(Revision of IEEE Std 1671.1-2009)
IEEE Standard for Automatic Test
Markup Language (ATML) Test
Description
Sponsor
IEEE Standards Coordinating Committee 20 (SCC20) on
Test and Diagnosis for Electronic Systems
Approved 6 December 2017
IEEE-SA Standards Board
2
Copyright © 2018 IEEE. All rights reserved.
Abstract: An exchange format, utilizing Extensible Markup Language (XML), for both the static
description of unit under test (UUT), and the specific description of UUT instance information is
defined in this standard.
Keywords: ATE, ATML, ATS, ATML instance document, automatic test equipment, Automatic
Test Markup Language, automatic test system, IEEE 1671.1, test program documentation, test
requirements, unit under test, UUT, XML schema
The Institute of Electrical and Electronics Engineers, Inc.
3 Park Avenue, New York, NY 10016-5997, USA
Copyright © 2018 by The Institute of Electrical and Electronics Engineers, Inc.
All rights reserved. Published 19 March 2018. Printed in the United States of America.
IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by The Institute of Electrical and Electronics
Engineers, Incorporated.
PDF: ISBN 978-1-5044-4631-0 STD22963
Print: ISBN 978-1-5044-4632-7 STDPD22963
IEEE prohibits discrimination, harassment, and bullying.
For more information, visit http://www.ieee.org/web/aboutus/whatis/policies/p9-26.html.
No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written
permission of the publisher.
摘要:

IEEE Std 1671.1-2017 是电气与电子工程师协会(IEEE)发布的一项重要标准,全称为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Station Information”。该标准属于IEEE 1671系列,专注于通过可扩展标记语言(XML)实

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作者:Carl 分类:国外协会 价格:20星币 属性:274 页 大小:4.65MB 格式:PDF 时间:2024-09-06

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